Manufacture and Metrology of Freeform and Off-Axis Axisymmetric Surfaces
Thursday – Friday, June 26 – 27, 2014
The Fairmont Orchid
1 North Kaniku Drive
Kohala Coast, Hawaii 96743
W. B. Lee, The Hong Kong Polytechnic University
Jeffrey W. Roblee, AMETEK - Precitech, Inc.
Daniel C. Thompson, Praecis, Inc.
Benny C. F. Cheung, The Hong Kong Polytechnic University
Christopher J. Evans, University of North Carolina – Charlotte
K. C. Fan, National Taiwan University
Fenzhou Fang, Tianjin University
Newman M. Marsilius, Moore Tool Company, Inc.
Seung-Han Yang, Kyungpook National University
William Zhang, NASA Goddard Space Flight Center
Call for Papers
The joint ASPE (American Society for Precision Engineering)/ASPEN (Asian Society for Precision Engineering and Nanotechnology)Summer Topical Meeting on theManufacture and Metrology of Freeform and Off-Axis Axisymmetric Surfacesis designed to focus industry, academic and governmental interest and expertise on the advancement of technologies essential to the manufacture of freeform and off-axis axisymmetric surfaces.The meeting will be held in conjunction with the OSA (Optical Society of America) Optical Fabrication and Testing (OF&T) conference, being held at the same location in the days preceding thejoint ASPE/ASPENTopical Meeting.
Precision freeform (FF) and off-axis axisymmetric (OAA) surfaces are becoming increasingly present in many application areas—particularly as manufacturing technologies evolve to enable their economical manufacture. Current and emerging examples include optics for astronomy (both space and ground-based), consumer optics (e.g., cell phone camera lenses), automotive (e.g., head and tail lamp lenses), biomedical devices, and a myriad of others. Advances in the manufacture of FF and OAA surfaces are critical to enabling the realization of numerous modern technologies; arrays of individually on axis aspheric elements pose all the same manufacturing problems as freeform optics, and enable technologies such as advanced computational imaging. For the purposes of this meeting, discussion topics will focus on applications where critical dimensions or feature sizes range from the meso- to the macro-scale.
The meeting organizers recognize the critical importance of metrology to the success of precision manufacturing processes; metrology is essential to control of the process, and therefore every bit as important as the process itself. Hence the topic of the meeting, where equal emphasis is placed on manufacturing and metrology.
TheASPE/ASPENorganizing committee will liase with the organizing committee for theOSA’s OF&Tmeeting.
Guidelines for Submitting Short Abstracts:
The abstract header should include a title, authors(s) and author(s) affiliation(s).
The author(s) should indicate preference for oral or poster presentation. Please note: when submitting the short abstract via the on-line link, the author will encounter a field that requests the author to enter his/her preference for type of presentation.
The author(s) should indicate preferred keywords (up to six).Please note: when submitting the short abstract via the on-line link, the author will encounter a field that allows the author to enter his/her keywords.
The body of the abstract should be limited to500 words.
Abstracts should be submitted electronically in PDF format, A4 page size.
Minimum font size should be 11 point.
Submit Your Short Abstract
January 31, 2014– Deadline for Short Abstracts
February 28, 2014– Notification of the results of the selection committee to all authors submitting abstracts
May 2, 2014– Deadline for submission of an extended 4-6 page abstract to be included in the conferenceProceedings.
June 26 – 27, 2014– 2014 ASPE/ASPEN Summer Topical Meeting, Manufacture and Metrology of Freeform and Off-Axis Axisymmetric Surfaces